Vortex Spin Torque Nano Oscillator-based PUF and TRNG Design for Lightweight Security Solutions

Kunal Kranti Das*, Sandeep Soni, Farshad Moradi, Sonal Shreya, Brajesh Kumar Kaushik

*Corresponding author for this work

Research output: Contribution to book/anthology/report/proceedingArticle in proceedingsResearch

Abstract

This paper addresses the limitations of traditional CMOS-based hardware security primitives by proposing an integrated physical unclonable functions (PUFs) and true random number generators (TRNGs) design utilizing the MTJ with vortex spin-torque nano oscillator (V-STNO) functionality. Considering the variation in V-STNO frequencies, the uniqueness and reliability of PUF are calculated as 50.3% and 97.41%, respectively. It demonstrates compactness with a relatively lower gate count and achieves low power consumption at 2.4 μ W per bit.

Original languageEnglish
Title of host publication2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
PublisherIEEE
Publication date2024
ISBN (Print)979 - 8 -3503 -7152 - 9
DOIs
Publication statusPublished - 2024
Event8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024 - Bangalore, India
Duration: 3 Mar 20246 Mar 2024

Conference

Conference8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024
Country/TerritoryIndia
CityBangalore
Period03/03/202406/03/2024

Keywords

  • Physical unclonable functions
  • True random number generators
  • Vortex spin-torque nano oscillator

Fingerprint

Dive into the research topics of 'Vortex Spin Torque Nano Oscillator-based PUF and TRNG Design for Lightweight Security Solutions'. Together they form a unique fingerprint.

Cite this