Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements

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Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements. / Wells, Justin; Kallehauge, Jesper; Hofmann, Philip.

In: Surface Science, Vol. 602, 2008, p. 1742-1749.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

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@article{633271d02d8a11dd9465000ea68e967b,
title = "Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements",
author = "Justin Wells and Jesper Kallehauge and Philip Hofmann",
year = "2008",
language = "English",
volume = "602",
pages = "1742--1749",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier BV * North-Holland",

}

RIS

TY - JOUR

T1 - Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements

AU - Wells, Justin

AU - Kallehauge, Jesper

AU - Hofmann, Philip

PY - 2008

Y1 - 2008

M3 - Journal article

VL - 602

SP - 1742

EP - 1749

JO - Surface Science

JF - Surface Science

SN - 0039-6028

ER -