Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

  • Afdeling for Medicinsk Fysik
  • Interdisciplinary Nanoscience Center
  • Institute for Storage Ring Facilities - Aarhus (ISA)
Original languageEnglish
JournalSurface Science
Pages (from-to)1742-1749
Publication statusPublished - 2008

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ID: 11478797