Abstract
Owing to their ability for fast switching and the large property contrast between the crystalline and amorphous states that permits multi-level data storage, in-memory computing and neuromorphic computing, the investigation of phase change materials (PCMs) remains a highly active field of research. Yet, the continuous increase in electrical resistance (called drift) observed in the amorphous phase has so far hindered the commercial implementation of multi-level data storage. It was recently shown that the resistance drift is caused by aging-induced structural relaxation of the glassy phase, which is accompanied by a simultaneous decrease in enthalpy and fictive temperature. This implies that resistance is related to enthalpy relaxation. While the resistance is known to drift even at room temperature and below, evidence for enthalpy relaxation at room temperature in amorphous PCMs is still missing. Here, we monitor changes in enthalpy induced by long-term room-temperature aging in a series of PCMs. Our results demonstrate the simultaneity of resistance drift and enthalpy relaxation at room temperature, and thus provide further insights into the mechanism of resistance drift and its possible remediation.
| Original language | English |
|---|---|
| Article number | 135101 |
| Journal | Journal of Applied Physics |
| Volume | 135 |
| Issue | 13 |
| ISSN | 0021-8979 |
| DOIs | |
| Publication status | Published - Apr 2024 |