Signal denoising based on dual tree complex wavelet transform and goodness of fit test

Khuram Naveed, Bisma Shaukat, Naveed ur Rehman

Research output: Contribution to book/anthology/report/proceeding › Article in proceedings › Research › peer-review

Original language	Undefined/Unknown
Title of host publication	2017 22nd International Conference on Digital Signal Processing (DSP)
Publisher	IEEE
Publication date	1 Aug 2017
DOIs	https://doi.org/10.1109/icdsp.2017.8096067
Publication status	Published - 1 Aug 2017

Access to Document

@inproceedings{cd5f4e043c1744b1834d5842627f064c,

title = "Signal denoising based on dual tree complex wavelet transform and goodness of fit test",

author = "Khuram Naveed and Bisma Shaukat and Rehman, {Naveed ur}",

year = "2017",

month = aug,

day = "1",

doi = "10.1109/icdsp.2017.8096067",

language = "Udefineret/Ukendt",

booktitle = "2017 22nd International Conference on Digital Signal Processing (DSP)",

publisher = "IEEE",

}

TY - GEN

T1 - Signal denoising based on dual tree complex wavelet transform and goodness of fit test

AU - Naveed, Khuram

AU - Shaukat, Bisma

AU - Rehman, Naveed ur

PY - 2017/8/1

Y1 - 2017/8/1

U2 - 10.1109/icdsp.2017.8096067

DO - 10.1109/icdsp.2017.8096067

M3 - Konferencebidrag i proceedings

BT - 2017 22nd International Conference on Digital Signal Processing (DSP)

PB - IEEE

ER -