Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Standard

Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments. / Froning, Jens P.; Xia, Dan; Zhang, Shuai; Laegsgaard, Erik; Besenbacher, Flemming; Dong, Mingdong.

In: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, Vol. 33, No. 2, 021801, 03.2015.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Harvard

Froning, JP, Xia, D, Zhang, S, Laegsgaard, E, Besenbacher, F & Dong, M 2015, 'Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments', Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, vol. 33, no. 2, 021801. https://doi.org/10.1116/1.4906517

APA

Froning, J. P., Xia, D., Zhang, S., Laegsgaard, E., Besenbacher, F., & Dong, M. (2015). Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, 33(2), [021801]. https://doi.org/10.1116/1.4906517

CBE

Froning JP, Xia D, Zhang S, Laegsgaard E, Besenbacher F, Dong M. 2015. Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures. 33(2). https://doi.org/10.1116/1.4906517

MLA

Froning, Jens P. et al. "Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments". Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures. 2015. 33(2). https://doi.org/10.1116/1.4906517

Vancouver

Froning JP, Xia D, Zhang S, Laegsgaard E, Besenbacher F, Dong M. Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures. 2015 Mar;33(2). 021801. https://doi.org/10.1116/1.4906517

Author

Froning, Jens P. ; Xia, Dan ; Zhang, Shuai ; Laegsgaard, Erik ; Besenbacher, Flemming ; Dong, Mingdong. / Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments. In: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures. 2015 ; Vol. 33, No. 2.

Bibtex

@article{a83bf8fa62b841d3b5dd99c3cf3924ff,
title = "Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments",
abstract = "A new design of a noncontact atomic force microscope (AFM) is introduced in this paper, based on a piezoelectric oscillator sensor (PEOS) for ambient and liquid environments. Because of the recent development of quartz technology, the PEOS sensor operates independently from conventional laser alignments. The sensor is based on the length extension resonator, which has high force sensitivity and can deliver high resolution AFM images in ultrahigh vacuum. The oscillator design was tested in different gas compositions and liquids to determine its oscillation stability. The scan performance was investigated in both air and liquid on the topography of an inorganic hard material, graphite. The usability of PEOS for soft organic materials was further proven by imaging biological samples of DNA origami. (C) 2015 American Vacuum Society.",
keywords = "SCANNING-TUNNELING-MICROSCOPY, RESOLUTION",
author = "Froning, {Jens P.} and Dan Xia and Shuai Zhang and Erik Laegsgaard and Flemming Besenbacher and Mingdong Dong",
year = "2015",
month = "3",
doi = "10.1116/1.4906517",
language = "English",
volume = "33",
journal = "Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures",
issn = "1071-1023",
publisher = "American Institute of Physics",
number = "2",

}

RIS

TY - JOUR

T1 - Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments

AU - Froning, Jens P.

AU - Xia, Dan

AU - Zhang, Shuai

AU - Laegsgaard, Erik

AU - Besenbacher, Flemming

AU - Dong, Mingdong

PY - 2015/3

Y1 - 2015/3

N2 - A new design of a noncontact atomic force microscope (AFM) is introduced in this paper, based on a piezoelectric oscillator sensor (PEOS) for ambient and liquid environments. Because of the recent development of quartz technology, the PEOS sensor operates independently from conventional laser alignments. The sensor is based on the length extension resonator, which has high force sensitivity and can deliver high resolution AFM images in ultrahigh vacuum. The oscillator design was tested in different gas compositions and liquids to determine its oscillation stability. The scan performance was investigated in both air and liquid on the topography of an inorganic hard material, graphite. The usability of PEOS for soft organic materials was further proven by imaging biological samples of DNA origami. (C) 2015 American Vacuum Society.

AB - A new design of a noncontact atomic force microscope (AFM) is introduced in this paper, based on a piezoelectric oscillator sensor (PEOS) for ambient and liquid environments. Because of the recent development of quartz technology, the PEOS sensor operates independently from conventional laser alignments. The sensor is based on the length extension resonator, which has high force sensitivity and can deliver high resolution AFM images in ultrahigh vacuum. The oscillator design was tested in different gas compositions and liquids to determine its oscillation stability. The scan performance was investigated in both air and liquid on the topography of an inorganic hard material, graphite. The usability of PEOS for soft organic materials was further proven by imaging biological samples of DNA origami. (C) 2015 American Vacuum Society.

KW - SCANNING-TUNNELING-MICROSCOPY

KW - RESOLUTION

U2 - 10.1116/1.4906517

DO - 10.1116/1.4906517

M3 - Journal article

VL - 33

JO - Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

SN - 1071-1023

IS - 2

M1 - 021801

ER -