Phase densities and lamellar morphologies of semicrystalline polyethylenes via absolute small-angle X-ray scattering measurements

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

  • Monika Basiura-Cembala, University of Bielsko-Biala, Poland
  • Kurt Erlacher, Bruker AXS
  • ,
  • Jan Skov Pedersen
  • Bart Goderis, Katholieke Universiteit Leuven, Bruxelles, Belgium
Original languageEnglish
JournalJournal of Applied Crystallography
Volume48
Issue5
Pages (from-to)1498-1506
Number of pages9
ISSN0021-8898
DOIs
Publication statusPublished - 2015

    Research areas

  • absolute invariant, amorphous phases, polyethylene, small-angle X-ray scattering

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