TY - JOUR
T1 - Optical Floating-Zone Furnace Single-Crystal Synthesis of van der Waals Material InSe
AU - Svane, Jacob
AU - Vosegaard, Emilie Skytte
AU - Kløve, Magnus
AU - Iversen, Bo Brummerstedt
N1 - Publisher Copyright:
© 2024 American Chemical Society.
PY - 2024/9/4
Y1 - 2024/9/4
N2 - Investigations of crystal structures and intrinsic properties of advanced materials require synthesis of high-quality single crystals. In case of incongruently melting solids, specialized growth methods must be applied, but these can be particularly challenging for two-dimensional (2D) van der Waals materials prone to twinning and defects. Here, a very rare synthesis of a large single crystal of an incongruently melting van der Waals material is reported using the traveling solvent floating zone method in an optical mirror furnace. Use of a melt zone with a delicately balanced stoichiometry yielded a ∼3 × 1 cm3 single crystal of InSe, which is a widely studied flexible semiconductor. The average crystal structure of InSe determined from single crystal X-ray diffraction reveals stacking disorder along the c-axis, which can be modeled by a major- (∼75%) and minor component (∼25%). The In-In and In-Se bond lengths are 2.775(3) and 2.632(3) Å, respectively, while the In-In-Se and Se-In-Se angles are 118.5(1) and 99.1(2)°, respectively. The van der Waals interlayer distance was found to be 3.08(3) Å. The easy layer-slippage appears to govern the mechanical flexibility demonstrated macroscopically with a bending test on the single crystal.
AB - Investigations of crystal structures and intrinsic properties of advanced materials require synthesis of high-quality single crystals. In case of incongruently melting solids, specialized growth methods must be applied, but these can be particularly challenging for two-dimensional (2D) van der Waals materials prone to twinning and defects. Here, a very rare synthesis of a large single crystal of an incongruently melting van der Waals material is reported using the traveling solvent floating zone method in an optical mirror furnace. Use of a melt zone with a delicately balanced stoichiometry yielded a ∼3 × 1 cm3 single crystal of InSe, which is a widely studied flexible semiconductor. The average crystal structure of InSe determined from single crystal X-ray diffraction reveals stacking disorder along the c-axis, which can be modeled by a major- (∼75%) and minor component (∼25%). The In-In and In-Se bond lengths are 2.775(3) and 2.632(3) Å, respectively, while the In-In-Se and Se-In-Se angles are 118.5(1) and 99.1(2)°, respectively. The van der Waals interlayer distance was found to be 3.08(3) Å. The easy layer-slippage appears to govern the mechanical flexibility demonstrated macroscopically with a bending test on the single crystal.
UR - http://www.scopus.com/inward/record.url?scp=85201432400&partnerID=8YFLogxK
U2 - 10.1021/acs.cgd.4c00520
DO - 10.1021/acs.cgd.4c00520
M3 - Journal article
AN - SCOPUS:85201432400
SN - 1528-7483
VL - 24
SP - 6965
EP - 6971
JO - Crystal Growth and Design
JF - Crystal Growth and Design
IS - 17
ER -