Open-source toolbox for photographic characterization of optical propagation

Simon R. Sørensen; Emil Z. Ulsig; Frederik E. Philip; Frederik R.B. Sørensen; Magnus L. Madsen; Asger B. Gardner; Peter Tønning; Simon T. Thomsen; Kevin B. Gravesen; Eric J. Stanton; Nicolas Volet

doi:10.1364/OL.529487

Open-source toolbox for photographic characterization of optical propagation

Simon R. Sørensen^*, Emil Z. Ulsig, Frederik E. Philip, Frederik R.B. Sørensen, Magnus L. Madsen, Asger B. Gardner, Peter Tønning, Simon T. Thomsen, Kevin B. Gravesen, Eric J. Stanton, Nicolas Volet

^*Corresponding author for this work

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaper › Journal article › Research › peer-review

2 Citations (Scopus)

Abstract

An alternative method for characterizing optical propagation in waveguide structures based on scattered light imaging is presented and demonstrated for the spectral range of 450-980 nm. Propagation losses as low as 1.40 dB/cm are demonstrated in alumina spiral waveguides. AlGaAs-on-insulator waveguides are measured using a tunable laser and compared to cut-back measurements. On AlGaAs, a one-sigma uncertainty of 1.40 and 2.23 dB/cm for TE and TM polarizations is obtained for repetitions of measurements conducted on the same waveguide, highlighting the approach's reproducibility. An open-source toolbox is introduced, allowing for reliable processing of data and estimation of optical propagation losses.

Original language	English
Journal	Optics Letters
Volume	49
Issue	15
Pages (from-to)	4098-4101
Number of pages	4
ISSN	0146-9592
DOIs	https://doi.org/10.1364/OL.529487
Publication status	Published - 1 Aug 2024

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title = "Open-source toolbox for photographic characterization of optical propagation",

abstract = "An alternative method for characterizing optical propagation in waveguide structures based on scattered light imaging is presented and demonstrated for the spectral range of 450-980 nm. Propagation losses as low as 1.40 dB/cm are demonstrated in alumina spiral waveguides. AlGaAs-on-insulator waveguides are measured using a tunable laser and compared to cut-back measurements. On AlGaAs, a one-sigma uncertainty of 1.40 and 2.23 dB/cm for TE and TM polarizations is obtained for repetitions of measurements conducted on the same waveguide, highlighting the approach's reproducibility. An open-source toolbox is introduced, allowing for reliable processing of data and estimation of optical propagation losses.",

author = "S{\o}rensen, {Simon R.} and Ulsig, {Emil Z.} and Philip, {Frederik E.} and S{\o}rensen, {Frederik R.B.} and Madsen, {Magnus L.} and Gardner, {Asger B.} and Peter T{\o}nning and Thomsen, {Simon T.} and Gravesen, {Kevin B.} and Stanton, {Eric J.} and Nicolas Volet",

year = "2024",

month = aug,

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doi = "10.1364/OL.529487",

language = "English",

volume = "49",

pages = "4098--4101",

journal = "Optics Letters",

issn = "0146-9592",

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TY - JOUR

T1 - Open-source toolbox for photographic characterization of optical propagation

AU - Sørensen, Simon R.

AU - Ulsig, Emil Z.

AU - Philip, Frederik E.

AU - Sørensen, Frederik R.B.

AU - Madsen, Magnus L.

AU - Gardner, Asger B.

AU - Tønning, Peter

AU - Thomsen, Simon T.

AU - Gravesen, Kevin B.

AU - Stanton, Eric J.

AU - Volet, Nicolas

PY - 2024/8/1

Y1 - 2024/8/1

N2 - An alternative method for characterizing optical propagation in waveguide structures based on scattered light imaging is presented and demonstrated for the spectral range of 450-980 nm. Propagation losses as low as 1.40 dB/cm are demonstrated in alumina spiral waveguides. AlGaAs-on-insulator waveguides are measured using a tunable laser and compared to cut-back measurements. On AlGaAs, a one-sigma uncertainty of 1.40 and 2.23 dB/cm for TE and TM polarizations is obtained for repetitions of measurements conducted on the same waveguide, highlighting the approach's reproducibility. An open-source toolbox is introduced, allowing for reliable processing of data and estimation of optical propagation losses.

AB - An alternative method for characterizing optical propagation in waveguide structures based on scattered light imaging is presented and demonstrated for the spectral range of 450-980 nm. Propagation losses as low as 1.40 dB/cm are demonstrated in alumina spiral waveguides. AlGaAs-on-insulator waveguides are measured using a tunable laser and compared to cut-back measurements. On AlGaAs, a one-sigma uncertainty of 1.40 and 2.23 dB/cm for TE and TM polarizations is obtained for repetitions of measurements conducted on the same waveguide, highlighting the approach's reproducibility. An open-source toolbox is introduced, allowing for reliable processing of data and estimation of optical propagation losses.

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U2 - 10.1364/OL.529487

DO - 10.1364/OL.529487

M3 - Journal article

C2 - 39090867

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SN - 0146-9592

VL - 49

SP - 4098

EP - 4101

JO - Optics Letters

JF - Optics Letters

IS - 15

ER -

Open-source toolbox for photographic characterization of optical propagation

Abstract

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