Observation and theory of the H2 defect in silicon

Brian Bech Nielsen, Jens Dybkjær Holbech, R. Jones, P. Sitch, S. Öberg

    Research output: Contribution to book/anthology/report/proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 17th International Conference on Defects in Semiconductors ICDS-17
    Publication date1993
    Publication statusPublished - 1993
    EventThe 17th International Conference on Defects in Semiconductors ICDS-17 - Gmunden, Austria
    Duration: 17 Dec 2010 → …

    Conference

    ConferenceThe 17th International Conference on Defects in Semiconductors ICDS-17
    Country/TerritoryAustria
    CityGmunden
    Period17/12/2010 → …

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