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Abstract
We present here a home built setup for measuring the specific resistivity, hall coefficient, and charge carrier concentration and mobility at elevated temperatures. The system is optimized for measurements of samples ranging between doped semiconductors and high resistivity metals and uses the van der Pauw method. The commercial availability of these systems is limited and they are usually not optimized for measurements on samples which show properties characteristic of thermoelectric materials.
We give an assessment of the reliability of the measurements and a comparison with a commercial system, the Quantum Design, Physical Properties Measurement System (PPMS). Measurements on samples with different resistivity and charge carrier concentration will be shown, covering both ends of the interval of samples we are able to measure as well as the range normally observed for thermoelectrics. The comparison will be based on room temperature measurements.
We give an assessment of the reliability of the measurements and a comparison with a commercial system, the Quantum Design, Physical Properties Measurement System (PPMS). Measurements on samples with different resistivity and charge carrier concentration will be shown, covering both ends of the interval of samples we are able to measure as well as the range normally observed for thermoelectrics. The comparison will be based on room temperature measurements.
| Original language | English |
|---|---|
| Publication date | 17 Jul 2011 |
| Publication status | Published - 17 Jul 2011 |
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Dive into the research topics of 'Home built equipment for measuring Hall coefficient and charge carrier concentration, mobility and resistivity'. Together they form a unique fingerprint.Activities
- 1 Participation in or organisation af a conference
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30th International Conference on Thermoelectrics
Borup, K. (Participant)
17 Jul 2011 → 21 Jul 2011Activity: Participating in or organising an event types › Participation in or organisation af a conference