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High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor

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High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor. / Wang, Yuting; Su, Yingchun; Zhang, Yanping et al.
In: ACS applied materials & interfaces, Vol. 14, No. 4, 02.2022, p. 5661-5672.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Harvard

Wang, Y, Su, Y, Zhang, Y & Chen, M 2022, 'High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor', ACS applied materials & interfaces, vol. 14, no. 4, pp. 5661-5672. https://doi.org/10.1021/acsami.1c23741

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MLA

Vancouver

Wang Y, Su Y, Zhang Y, Chen M. High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor. ACS applied materials & interfaces. 2022 Feb;14(4):5661-5672. Epub 2022 Jan 20. doi: 10.1021/acsami.1c23741

Author

Wang, Yuting ; Su, Yingchun ; Zhang, Yanping et al. / High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor. In: ACS applied materials & interfaces. 2022 ; Vol. 14, No. 4. pp. 5661-5672.

Bibtex

@article{0ee04cc1773e40488395998a3d4779a1,
title = "High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor",
abstract = "Nanocomposite percolation networks have attracted increasing attention in the field of wearable devices. Generally, the large junction resistance caused by the small contact area in the percolation network is considered as the bottleneck in preparing high-performance electronics. In such electronics, an applied strain will lead to deformation on the fiber junction, subsequently increasing the sheet resistance. However, taking advantage of the dominant role of the contact resistance in the percolation network, the overall resistance of the network can be controlled by skillfully adjusting the contact area. Here, we designed a combined gold-polycaprolactone (Au-PCL) network with a unique buckling net structure. When the thickness of the gold nanolayer is 50 nm, the network shows typical percolation behavior with high transparency (93%), good conductivity (20 Ω/sq), and good ductility. Moreover, the networks show a unique positive relationship between the conductivity and strain due to the variation of contact resistance. By designing different waving angles, the network can be used as a dynamic strain sensor with a tunable gauge factor ranging from -0.8 to -1.8. Overall, these highly stretchable and transparent Au-PCL networks show promising applications in the field of high-performance electronic and optoelectronic nanodevices.",
author = "Yuting Wang and Yingchun Su and Yanping Zhang and Menglin Chen",
year = "2022",
month = feb,
doi = "10.1021/acsami.1c23741",
language = "English",
volume = "14",
pages = "5661--5672",
journal = "A C S Applied Materials and Interfaces",
issn = "1944-8244",
publisher = "American Chemical Society",
number = "4",

}

RIS

TY - JOUR

T1 - High-Voltage Wave Induced a Unique Structured Percolation Network with a Negative Gauge Factor

AU - Wang, Yuting

AU - Su, Yingchun

AU - Zhang, Yanping

AU - Chen, Menglin

PY - 2022/2

Y1 - 2022/2

N2 - Nanocomposite percolation networks have attracted increasing attention in the field of wearable devices. Generally, the large junction resistance caused by the small contact area in the percolation network is considered as the bottleneck in preparing high-performance electronics. In such electronics, an applied strain will lead to deformation on the fiber junction, subsequently increasing the sheet resistance. However, taking advantage of the dominant role of the contact resistance in the percolation network, the overall resistance of the network can be controlled by skillfully adjusting the contact area. Here, we designed a combined gold-polycaprolactone (Au-PCL) network with a unique buckling net structure. When the thickness of the gold nanolayer is 50 nm, the network shows typical percolation behavior with high transparency (93%), good conductivity (20 Ω/sq), and good ductility. Moreover, the networks show a unique positive relationship between the conductivity and strain due to the variation of contact resistance. By designing different waving angles, the network can be used as a dynamic strain sensor with a tunable gauge factor ranging from -0.8 to -1.8. Overall, these highly stretchable and transparent Au-PCL networks show promising applications in the field of high-performance electronic and optoelectronic nanodevices.

AB - Nanocomposite percolation networks have attracted increasing attention in the field of wearable devices. Generally, the large junction resistance caused by the small contact area in the percolation network is considered as the bottleneck in preparing high-performance electronics. In such electronics, an applied strain will lead to deformation on the fiber junction, subsequently increasing the sheet resistance. However, taking advantage of the dominant role of the contact resistance in the percolation network, the overall resistance of the network can be controlled by skillfully adjusting the contact area. Here, we designed a combined gold-polycaprolactone (Au-PCL) network with a unique buckling net structure. When the thickness of the gold nanolayer is 50 nm, the network shows typical percolation behavior with high transparency (93%), good conductivity (20 Ω/sq), and good ductility. Moreover, the networks show a unique positive relationship between the conductivity and strain due to the variation of contact resistance. By designing different waving angles, the network can be used as a dynamic strain sensor with a tunable gauge factor ranging from -0.8 to -1.8. Overall, these highly stretchable and transparent Au-PCL networks show promising applications in the field of high-performance electronic and optoelectronic nanodevices.

U2 - 10.1021/acsami.1c23741

DO - 10.1021/acsami.1c23741

M3 - Journal article

C2 - 35050585

VL - 14

SP - 5661

EP - 5672

JO - A C S Applied Materials and Interfaces

JF - A C S Applied Materials and Interfaces

SN - 1944-8244

IS - 4

ER -