Growth and structure of singly oriented single-layer tungsten disulfide on Au(111)

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  • Luca Bignardi, Elettra-Sincrotrone Trieste S.C.p.A.
  • ,
  • Daniel Lizzit, Elettra-Sincrotrone Trieste S.C.p.A.
  • ,
  • Harsh Bana, University of Trieste
  • ,
  • Elisabetta Travaglia, University of Trieste
  • ,
  • Paolo Lacovig, Elettra-Sincrotrone Trieste S.C.p.A.
  • ,
  • Charlotte E. Sanders
  • ,
  • Maciej Dendzik
  • ,
  • Matteo Michiardi
  • ,
  • Marco Bianchi
  • Moritz Ewert, Universitat Bremen
  • ,
  • Lars Buß, Universitat Bremen
  • ,
  • Jens Falta, Universitat Bremen
  • ,
  • Jan Ingo Flege, Universitat Bremen
  • ,
  • Alessandro Baraldi, Elettra-Sincrotrone Trieste S.C.p.A., University of Trieste, IOM-CNR Laboratorio TASC
  • ,
  • Rosanna Larciprete, CNR, Institute for Complex Systems, Roma
  • ,
  • Philip Hofmann
  • Silvano Lizzit, Elettra-Sincrotrone Trieste S.C.p.A.

A singly oriented, single layer of tungsten disulfide (WS2) was epitaxially grown on Au(111) and characterized at the nanoscale by combining photoelectron spectroscopy, photoelectron diffraction, and low-energy electron microscopy. Fast x-ray photoelectron spectroscopy revealed that the growth of a single crystalline orientation is triggered by choosing a low W evaporation rate and performing the process with a high temperature of the substrate. Information about the single orientation of the layer was obtained by acquiring x-ray photoelectron diffraction patterns, revealing a 1H polytype for the WS2 layer and, moreover, determining the structural parameters and registry with the substrate. The distribution, size, and orientation of the WS2 layer were further ascertained by low-energy electron microscopy.

Original languageEnglish
Article number014003
JournalPhysical Review Materials
Volume3
Issue1
Number of pages8
ISSN2476-0455
DOIs
Publication statusPublished - Jan 2019

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