MultiRef: software platform for Rietveld refinement of multiple powder diffractograms from in situ, scanning or diffraction tomography experiments

Simon Frølich, Henrik Birkedal

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Original languageEnglish
JournalJournal of Applied Crystallography
Volume48
Pages (from-to)2019-2025
Number of pages7
ISSN0021-8898
DOIs
Publication statusPublished - 2015

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