Distance Metrology with Integrated Mode-Locked Ring Laser

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

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Distance Metrology with Integrated Mode-Locked Ring Laser. / Hei, Kefei; Shi, Guang; Hansel, Andreas; Deng, Zhongwen; Latkowski, Sylwester; Van Den Berg, Steven A.; Bente, Erwin; Bhattacharya, Nandini.

In: IEEE Photonics Journal, Vol. 11, No. 6, 12.2019, p. 1-10.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Harvard

Hei, K, Shi, G, Hansel, A, Deng, Z, Latkowski, S, Van Den Berg, SA, Bente, E & Bhattacharya, N 2019, 'Distance Metrology with Integrated Mode-Locked Ring Laser', IEEE Photonics Journal, vol. 11, no. 6, pp. 1-10. https://doi.org/10.1109/JPHOT.2019.2940068

APA

Hei, K., Shi, G., Hansel, A., Deng, Z., Latkowski, S., Van Den Berg, S. A., Bente, E., & Bhattacharya, N. (2019). Distance Metrology with Integrated Mode-Locked Ring Laser. IEEE Photonics Journal, 11(6), 1-10. https://doi.org/10.1109/JPHOT.2019.2940068

CBE

Hei K, Shi G, Hansel A, Deng Z, Latkowski S, Van Den Berg SA, Bente E, Bhattacharya N. 2019. Distance Metrology with Integrated Mode-Locked Ring Laser. IEEE Photonics Journal. 11(6):1-10. https://doi.org/10.1109/JPHOT.2019.2940068

MLA

Vancouver

Hei K, Shi G, Hansel A, Deng Z, Latkowski S, Van Den Berg SA et al. Distance Metrology with Integrated Mode-Locked Ring Laser. IEEE Photonics Journal. 2019 Dec;11(6):1-10. https://doi.org/10.1109/JPHOT.2019.2940068

Author

Hei, Kefei ; Shi, Guang ; Hansel, Andreas ; Deng, Zhongwen ; Latkowski, Sylwester ; Van Den Berg, Steven A. ; Bente, Erwin ; Bhattacharya, Nandini. / Distance Metrology with Integrated Mode-Locked Ring Laser. In: IEEE Photonics Journal. 2019 ; Vol. 11, No. 6. pp. 1-10.

Bibtex

@article{46ebbee168c4454fb344cc483a706de9,
title = "Distance Metrology with Integrated Mode-Locked Ring Laser",
abstract = "The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip source with a repetition rate of 2.5 GHz and a spectral bandwidth of 3 nm is coupled into a Michelson interferometer. The interferometer output is recorded as a spectral interferogram, which is captured in a single camera image. The images are analyzed using Hilbert transform to extract the distance. The distance derived shows a deviation of 6 \mum from the reference, for a distance up to 25 mm. We also demonstrate interferometry with repetition frequency sweep which can also be used with the source. Performance is expected to be better in the near future with the rapid developments in the field of on-chip laser sources which are demonstrating larger spectral widths and coherence lengths.",
keywords = "Metrology, mode-locked lasers and integrated optics",
author = "Kefei Hei and Guang Shi and Andreas Hansel and Zhongwen Deng and Sylwester Latkowski and {Van Den Berg}, {Steven A.} and Erwin Bente and Nandini Bhattacharya",
year = "2019",
month = dec,
doi = "10.1109/JPHOT.2019.2940068",
language = "English",
volume = "11",
pages = "1--10",
journal = "I E E E Photonics Journal",
issn = "1943-0655",
publisher = "institute of electrical and electronics engineers (ieee)",
number = "6",

}

RIS

TY - JOUR

T1 - Distance Metrology with Integrated Mode-Locked Ring Laser

AU - Hei, Kefei

AU - Shi, Guang

AU - Hansel, Andreas

AU - Deng, Zhongwen

AU - Latkowski, Sylwester

AU - Van Den Berg, Steven A.

AU - Bente, Erwin

AU - Bhattacharya, Nandini

PY - 2019/12

Y1 - 2019/12

N2 - The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip source with a repetition rate of 2.5 GHz and a spectral bandwidth of 3 nm is coupled into a Michelson interferometer. The interferometer output is recorded as a spectral interferogram, which is captured in a single camera image. The images are analyzed using Hilbert transform to extract the distance. The distance derived shows a deviation of 6 \mum from the reference, for a distance up to 25 mm. We also demonstrate interferometry with repetition frequency sweep which can also be used with the source. Performance is expected to be better in the near future with the rapid developments in the field of on-chip laser sources which are demonstrating larger spectral widths and coherence lengths.

AB - The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip source with a repetition rate of 2.5 GHz and a spectral bandwidth of 3 nm is coupled into a Michelson interferometer. The interferometer output is recorded as a spectral interferogram, which is captured in a single camera image. The images are analyzed using Hilbert transform to extract the distance. The distance derived shows a deviation of 6 \mum from the reference, for a distance up to 25 mm. We also demonstrate interferometry with repetition frequency sweep which can also be used with the source. Performance is expected to be better in the near future with the rapid developments in the field of on-chip laser sources which are demonstrating larger spectral widths and coherence lengths.

KW - Metrology

KW - mode-locked lasers and integrated optics

UR - http://www.scopus.com/inward/record.url?scp=85077755623&partnerID=8YFLogxK

U2 - 10.1109/JPHOT.2019.2940068

DO - 10.1109/JPHOT.2019.2940068

M3 - Journal article

AN - SCOPUS:85077755623

VL - 11

SP - 1

EP - 10

JO - I E E E Photonics Journal

JF - I E E E Photonics Journal

SN - 1943-0655

IS - 6

ER -