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Determination of thermoelectric properties from micro four-point probe measurements

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Determination of thermoelectric properties from micro four-point probe measurements. / Guralnik, Benny; Hansen, Ole; Stilling-Andersen, Andreas R. et al.

In: Measurement Science and Technology, Vol. 33, No. 12, 125001, 12.2022.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Harvard

Guralnik, B, Hansen, O, Stilling-Andersen, AR, Hansen, SE, Borup, K, Mihiretie, BM, Beltrán-Pitarch, B, Henrichsen, HH, Lin, R, Shiv, L, Iversen, BB, Nielsen, PF & Petersen, DH 2022, 'Determination of thermoelectric properties from micro four-point probe measurements', Measurement Science and Technology, vol. 33, no. 12, 125001. https://doi.org/10.1088/1361-6501/ac88ea

APA

Guralnik, B., Hansen, O., Stilling-Andersen, A. R., Hansen, S. E., Borup, K., Mihiretie, B. M., Beltrán-Pitarch, B., Henrichsen, H. H., Lin, R., Shiv, L., Iversen, B. B., Nielsen, P. F., & Petersen, D. H. (2022). Determination of thermoelectric properties from micro four-point probe measurements. Measurement Science and Technology, 33(12), [125001]. https://doi.org/10.1088/1361-6501/ac88ea

CBE

Guralnik B, Hansen O, Stilling-Andersen AR, Hansen SE, Borup K, Mihiretie BM, Beltrán-Pitarch B, Henrichsen HH, Lin R, Shiv L, et al. 2022. Determination of thermoelectric properties from micro four-point probe measurements. Measurement Science and Technology. 33(12):Article 125001. https://doi.org/10.1088/1361-6501/ac88ea

MLA

Vancouver

Guralnik B, Hansen O, Stilling-Andersen AR, Hansen SE, Borup K, Mihiretie BM et al. Determination of thermoelectric properties from micro four-point probe measurements. Measurement Science and Technology. 2022 Dec;33(12):125001. doi: 10.1088/1361-6501/ac88ea

Author

Guralnik, Benny ; Hansen, Ole ; Stilling-Andersen, Andreas R. et al. / Determination of thermoelectric properties from micro four-point probe measurements. In: Measurement Science and Technology. 2022 ; Vol. 33, No. 12.

Bibtex

@article{3824d44030434dd8aa460d2f731fa485,
title = "Determination of thermoelectric properties from micro four-point probe measurements",
abstract = "Micro four-point probing is a branch of electrical metrology where electrical (and electromagnetic) properties of charge carriers such as conductance, mobility, and tunneling magnetoresistance can be accurately and precisely determined at the µm scale and below. Here, we propose and demonstrate a novel application of micro four-point probe (M4PP) aimed at quantifying the thermoelectric properties of a sample. Specifically, we show that for an AC current passing through a bulk material at a low angular frequency ω, the voltage drop across the sensing electrodes at 2ω is to first order proportional to the ratio (α/κ) of its Seebeck coefficient (α) to its thermal conductivity (κ). Verified by numerical simulations, our analytic theory is then put into practice on a suite of p- and n-type bulk semiconductors (Si, Ge, and BiTe). The M4PP estimates of the Seebeck coefficient in these materials are characterized both by high accuracy and precision, suggesting a novel in-situ metrology of thermoelectric properties at the µm scale.",
keywords = "2 ω method, Seebeck coefficient, micro four-point probe, self-heating effect",
author = "Benny Guralnik and Ole Hansen and Stilling-Andersen, {Andreas R.} and Hansen, {S{\o}ren E.} and Kasper Borup and Mihiretie, {Besira M.} and Braulio Beltr{\'a}n-Pitarch and Henrichsen, {Henrik H.} and Rong Lin and Lior Shiv and Iversen, {Bo Brummerstedt} and Nielsen, {Peter F.} and Petersen, {Dirch H.}",
year = "2022",
month = dec,
doi = "10.1088/1361-6501/ac88ea",
language = "English",
volume = "33",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "Institute of Physics Publishing Ltd.",
number = "12",

}

RIS

TY - JOUR

T1 - Determination of thermoelectric properties from micro four-point probe measurements

AU - Guralnik, Benny

AU - Hansen, Ole

AU - Stilling-Andersen, Andreas R.

AU - Hansen, Søren E.

AU - Borup, Kasper

AU - Mihiretie, Besira M.

AU - Beltrán-Pitarch, Braulio

AU - Henrichsen, Henrik H.

AU - Lin, Rong

AU - Shiv, Lior

AU - Iversen, Bo Brummerstedt

AU - Nielsen, Peter F.

AU - Petersen, Dirch H.

PY - 2022/12

Y1 - 2022/12

N2 - Micro four-point probing is a branch of electrical metrology where electrical (and electromagnetic) properties of charge carriers such as conductance, mobility, and tunneling magnetoresistance can be accurately and precisely determined at the µm scale and below. Here, we propose and demonstrate a novel application of micro four-point probe (M4PP) aimed at quantifying the thermoelectric properties of a sample. Specifically, we show that for an AC current passing through a bulk material at a low angular frequency ω, the voltage drop across the sensing electrodes at 2ω is to first order proportional to the ratio (α/κ) of its Seebeck coefficient (α) to its thermal conductivity (κ). Verified by numerical simulations, our analytic theory is then put into practice on a suite of p- and n-type bulk semiconductors (Si, Ge, and BiTe). The M4PP estimates of the Seebeck coefficient in these materials are characterized both by high accuracy and precision, suggesting a novel in-situ metrology of thermoelectric properties at the µm scale.

AB - Micro four-point probing is a branch of electrical metrology where electrical (and electromagnetic) properties of charge carriers such as conductance, mobility, and tunneling magnetoresistance can be accurately and precisely determined at the µm scale and below. Here, we propose and demonstrate a novel application of micro four-point probe (M4PP) aimed at quantifying the thermoelectric properties of a sample. Specifically, we show that for an AC current passing through a bulk material at a low angular frequency ω, the voltage drop across the sensing electrodes at 2ω is to first order proportional to the ratio (α/κ) of its Seebeck coefficient (α) to its thermal conductivity (κ). Verified by numerical simulations, our analytic theory is then put into practice on a suite of p- and n-type bulk semiconductors (Si, Ge, and BiTe). The M4PP estimates of the Seebeck coefficient in these materials are characterized both by high accuracy and precision, suggesting a novel in-situ metrology of thermoelectric properties at the µm scale.

KW - 2 ω method

KW - Seebeck coefficient

KW - micro four-point probe

KW - self-heating effect

UR - https://iopscience.iop.org/article/10.1088/1361-6501/ac88ea/pdf

U2 - 10.1088/1361-6501/ac88ea

DO - 10.1088/1361-6501/ac88ea

M3 - Journal article

VL - 33

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 12

M1 - 125001

ER -