Standard
Harvard
Enevoldsen, GH, Pinto, HP, Foster, AS, Jensen, MCR, Kühnle, A, Reichling, M, Hofer, WA
, Lauritsen, JV & Besenbacher, F 2008, '
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface',
Physical Review B, vol. 78, pp. 045416.
https://doi.org/10.1103/PhysRevB.78.045416
APA
Enevoldsen, G. H., Pinto, H. P., Foster, A. S., Jensen, M. C. R., Kühnle, A., Reichling, M., Hofer, W. A.
, Lauritsen, J. V., & Besenbacher, F. (2008).
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface.
Physical Review B,
78, 045416.
https://doi.org/10.1103/PhysRevB.78.045416
CBE
MLA
Vancouver
Author
Bibtex
@article{40f13180862a11dda5a8000ea68e967b,
title = "Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface",
author = "Enevoldsen, {Georg Herborg} and Pinto, {Henry P.} and Foster, {Adam S.} and Jensen, {Mona Christine Robenhagen} and Angelika K{\"u}hnle and Michael Reichling and Hofer, {Werner A.} and Lauritsen, {Jeppe Vang} and Flemming Besenbacher",
note = "Paper id:: DOI: 10.1103/PhysRevB.78.045416",
year = "2008",
doi = "10.1103/PhysRevB.78.045416",
language = "English",
volume = "78",
pages = "045416",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
}
RIS
TY - JOUR
T1 - Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface
AU - Enevoldsen, Georg Herborg
AU - Pinto, Henry P.
AU - Foster, Adam S.
AU - Jensen, Mona Christine Robenhagen
AU - Kühnle, Angelika
AU - Reichling, Michael
AU - Hofer, Werner A.
AU - Lauritsen, Jeppe Vang
AU - Besenbacher, Flemming
N1 - Paper id:: DOI: 10.1103/PhysRevB.78.045416
PY - 2008
Y1 - 2008
U2 - 10.1103/PhysRevB.78.045416
DO - 10.1103/PhysRevB.78.045416
M3 - Journal article
VL - 78
SP - 045416
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
ER -