Design and characterization of arrayed waveguide gratings using ultra-low loss Si3N4 waveguides

Jared F. Bauters*, James R. Adleman, Martijn J R Heck, John E. Bowers

*Corresponding author for this work

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

Abstract

Planar waveguides with ultra-low propagation loss are necessary for integrating optoelectronic systems that require long optical time delay or narrowband optical filters. In this paper, we review an ultra-low loss planar waveguide platform that uses thin (<150 nm) Si3N4 cores and thick (>8 μm) SiO2 cladding layers. In particular, we discuss the performance of arrayed waveguide gratings (AWGs) fabricated with the platform. We propose the use of a practical design method that takes the statistical nature of worst-case crosstalk into account. We also demonstrate the measurement of amplitude and phase error distributions in an AWG using an optical backscatter reflectometer. We show that the waveguides have phase errors small enough to achieve AWG crosstalk below -30 dB, while crosstalk below -40 dB should also be possible with optimization of the component design.

Original languageEnglish
JournalApplied Physics A: Materials Science & Processing
Volume116
Issue2
Pages (from-to)427-432
Number of pages6
ISSN0947-8396
DOIs
Publication statusPublished - 2014
Externally publishedYes

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