Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries

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Beyond imaging : Applications of atomic force microscopy for the study of Lithium-ion batteries. / Zhao, Weidong; Song, Wentao; Cheong, Ling Zhi; Wang, Deyu; Li, Hong; Besenbacher, Flemming; Huang, Fuqiang; Shen, Cai.

In: Ultramicroscopy, Vol. 204, 09.2019, p. 34-48.

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperReviewResearchpeer-review

Harvard

Zhao, W, Song, W, Cheong, LZ, Wang, D, Li, H, Besenbacher, F, Huang, F & Shen, C 2019, 'Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries', Ultramicroscopy, vol. 204, pp. 34-48. https://doi.org/10.1016/j.ultramic.2019.05.004

APA

Zhao, W., Song, W., Cheong, L. Z., Wang, D., Li, H., Besenbacher, F., Huang, F., & Shen, C. (2019). Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries. Ultramicroscopy, 204, 34-48. https://doi.org/10.1016/j.ultramic.2019.05.004

CBE

MLA

Vancouver

Author

Zhao, Weidong ; Song, Wentao ; Cheong, Ling Zhi ; Wang, Deyu ; Li, Hong ; Besenbacher, Flemming ; Huang, Fuqiang ; Shen, Cai. / Beyond imaging : Applications of atomic force microscopy for the study of Lithium-ion batteries. In: Ultramicroscopy. 2019 ; Vol. 204. pp. 34-48.

Bibtex

@article{4d926d7b5b214c0b8776db04a926aaf6,
title = "Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries",
abstract = "Research and development of lithium-ion batteries (LIBs)require powerful characterization approaches. Atomic force microscopy (AFM)is a multifunctional method that allows investigation of the topography, the electrochemical reactions, the ion transport phenomena, and the surface potential of samples at high resolution. Thus, this technique plays an increasingly important role in the study of LIBs. Herein, the progresses made in the application of AFM for the study of LIBs are reviewed and discussed.",
keywords = "Atomic force microscopy, Ion transport, Lithium-ion battery, Solid electrolyte interphase",
author = "Weidong Zhao and Wentao Song and Cheong, {Ling Zhi} and Deyu Wang and Hong Li and Flemming Besenbacher and Fuqiang Huang and Cai Shen",
year = "2019",
month = sep,
doi = "10.1016/j.ultramic.2019.05.004",
language = "English",
volume = "204",
pages = "34--48",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier BV",

}

RIS

TY - JOUR

T1 - Beyond imaging

T2 - Applications of atomic force microscopy for the study of Lithium-ion batteries

AU - Zhao, Weidong

AU - Song, Wentao

AU - Cheong, Ling Zhi

AU - Wang, Deyu

AU - Li, Hong

AU - Besenbacher, Flemming

AU - Huang, Fuqiang

AU - Shen, Cai

PY - 2019/9

Y1 - 2019/9

N2 - Research and development of lithium-ion batteries (LIBs)require powerful characterization approaches. Atomic force microscopy (AFM)is a multifunctional method that allows investigation of the topography, the electrochemical reactions, the ion transport phenomena, and the surface potential of samples at high resolution. Thus, this technique plays an increasingly important role in the study of LIBs. Herein, the progresses made in the application of AFM for the study of LIBs are reviewed and discussed.

AB - Research and development of lithium-ion batteries (LIBs)require powerful characterization approaches. Atomic force microscopy (AFM)is a multifunctional method that allows investigation of the topography, the electrochemical reactions, the ion transport phenomena, and the surface potential of samples at high resolution. Thus, this technique plays an increasingly important role in the study of LIBs. Herein, the progresses made in the application of AFM for the study of LIBs are reviewed and discussed.

KW - Atomic force microscopy

KW - Ion transport

KW - Lithium-ion battery

KW - Solid electrolyte interphase

UR - http://www.scopus.com/inward/record.url?scp=85065877464&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2019.05.004

DO - 10.1016/j.ultramic.2019.05.004

M3 - Review

C2 - 31128412

AN - SCOPUS:85065877464

VL - 204

SP - 34

EP - 48

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -