Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces

Jeppe Vang Lauritsen, Michael Reichling

    Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal articleResearchpeer-review

    81 Citations (Scopus)

    Abstract

    Udgivelsesdato: Juli
    Original languageEnglish
    JournalJournal of Physics: Condensed Matter
    Volume22
    Issue26
    ISSN0953-8984
    DOIs
    Publication statusPublished - 2010

    Cite this