@inproceedings{52a044f56f554607b05ebc626cfbd8ac,
title = "Suspended subwavelength gratings for optical processing and optomechanics",
abstract = "Owing to their high optical and mechanical quality suspended silicon nitride thin films are widely used for photonics and sensing applications. We discuss the fabrication and characterization of highly reflective one- dimensional subwavelength gratings patterned on commercial high-tensile stress Si3N4 membranes. Their non- invasive structural characterization using Atomic Force Microscopy provides detailed information on both the grating transverse profile and the deflection of the films after etching, which are compared with optical measurements and mechanical simulations, respectively. We then apply these ultrathin, low-loss optical components to optical spatial differentiation and demonstrate high quality first- and second-order spatial differentiation of the transverse profile of a Gaussian beam. ",
keywords = "Atomic force microscopy, Membrane deflection, Optical spatial differentiation, Subwavelength grating",
author = "Darki, {Ali A.} and Alexios Parthenopoulos and Jeppesen, {Bjarke R.} and Nygaard, {Jens V.} and Aur{\'e}lien Dantan",
note = "Publisher Copyright: {\textcopyright} 2021 SPIE.; High Contrast Metastructures X 2021 ; Conference date: 06-03-2021 Through 11-03-2021",
year = "2021",
doi = "10.1117/12.2585455",
language = "English",
series = "Proceedings of SPIE ",
publisher = "SPIE - International Society for Optical Engineering",
editor = "Chang-Hasnain, {Connie J.} and Fan, {Jonathan A.} and Weimin Zhou",
booktitle = "High Contrast Metastructures X",
address = "United States",
}