Product Quality Control in Assembly Machine under Data Restricted Settings

Fatemeh Kakavandi; Roger  de Reus; Cláudio Gomes; Negar Heidari; Alexandros Iosifidis; Peter Gorm Larsen

doi:10.1109/INDIN51773.2022.9976173

Product Quality Control in Assembly Machine under Data Restricted Settings

Fatemeh Kakavandi^*, Roger de Reus, Cláudio Gomes, Negar Heidari, Alexandros Iosifidis, Peter Gorm Larsen

^*Corresponding author af dette arbejde

Institut for Elektro- og Computerteknologi - Software Engineering & Computing systems
Institut for Elektro- og Computerteknologi - Signal Processing and Machine learning - Edison

Publikation: Bidrag til bog/antologi/rapport/proceeding › Konferencebidrag i proceedings › Forskning › peer review

2 Citationer (Scopus)

Abstract

Originalsprog	Engelsk
Titel	2022 IEEE 20th International Conference on Industrial Informatics, INDIN 2022
Antal sider	7
Forlag	IEEE
Publikationsdato	dec. 2022
Sider	735-741
ISBN (Elektronisk)	978-1-7281-7568-3
DOI	https://doi.org/10.1109/INDIN51773.2022.9976173
Status	Udgivet - dec. 2022
Begivenhed	2022 IEEE 20th International Conference on Industrial Informatics - Online, Perth, Australien Varighed: 25 jul. 2022 → 28 jul. 2022 https://2022.ieee-indin.org/

Konference

Konference	2022 IEEE 20th International Conference on Industrial Informatics
Lokation	Online
Land/Område	Australien
By	Perth
Periode	25/07/2022 → 28/07/2022
Internetadresse	https://2022.ieee-indin.org/

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10.1109/INDIN51773.2022.9976173

Citationsformater

@inproceedings{3db6789109fc4ab5a5d0cf1a296b2a6a,

title = "Product Quality Control in Assembly Machine under Data Restricted Settings",

author = "Fatemeh Kakavandi and {de Reus}, Roger and Cl{\'a}udio Gomes and Negar Heidari and Alexandros Iosifidis and Larsen, {Peter Gorm}",

year = "2022",

month = dec,

doi = "10.1109/INDIN51773.2022.9976173",

language = "English",

pages = "735--741",

booktitle = "2022 IEEE 20th International Conference on Industrial Informatics, INDIN 2022",

publisher = "IEEE",

note = "2022 IEEE 20th International Conference on Industrial Informatics ; Conference date: 25-07-2022 Through 28-07-2022",

url = "https://2022.ieee-indin.org/",

}

Kakavandi, F, de Reus, R, Gomes, C, Heidari, N, Iosifidis, A & Larsen, PG 2022, Product Quality Control in Assembly Machine under Data Restricted Settings. i 2022 IEEE 20th International Conference on Industrial Informatics, INDIN 2022. IEEE, s. 735-741, 2022 IEEE 20th International Conference on Industrial Informatics , Perth, Vestaustralien, Australien, 25/07/2022. https://doi.org/10.1109/INDIN51773.2022.9976173

TY - GEN

T1 - Product Quality Control in Assembly Machine under Data Restricted Settings

AU - Kakavandi, Fatemeh

AU - de Reus, Roger

AU - Gomes, Cláudio

AU - Heidari, Negar

AU - Iosifidis, Alexandros

AU - Larsen, Peter Gorm

PY - 2022/12

Y1 - 2022/12

U2 - 10.1109/INDIN51773.2022.9976173

DO - 10.1109/INDIN51773.2022.9976173

M3 - Article in proceedings

SP - 735

EP - 741

BT - 2022 IEEE 20th International Conference on Industrial Informatics, INDIN 2022

PB - IEEE

T2 - 2022 IEEE 20th International Conference on Industrial Informatics

Y2 - 25 July 2022 through 28 July 2022

ER -

Product Quality Control in Assembly Machine under Data Restricted Settings

Abstract

Konference

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Citationsformater