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Photoionization study of Kr and Xe ions with the combined use of a merged-beam set-up and an ion trap

Publikation: Bidrag til tidsskrift/Konferencebidrag i tidsskrift /Bidrag til avis › Tidsskriftartikel › Forskning › peer review

DOI

  • J.M. Bizau, Universite Paris-Sud
    • ,
  • D. Cubaynes, Universite Paris-Sud
    • ,
  • N. El Hassan, Universite Paris-Sud
    • ,
  • C. Blancard, Bruyères-le-Châtel
    • ,
  • M. Coreno, Rome branch and Gas Phase Beamline/Elettra
    • ,
  • C. Dehon, Universite Paris-Sud
    • ,
  • J. Lemaire, Universite Paris-Sud
    • ,
  • F. Folkmann
  • M.F. Gharaibeh, Jordan University of Sciences and Technology
    • ,
  • A. Giuliani, Institut national de la recherche agronomique (INRA)
    • ,
  • A.R. Milosavljević, L'Orme des Merisiers, Saint Aubin
    • ,
  • C. Nicolas, L'Orme des Merisiers, Saint Aubin
    • ,
  • R. Thissen, Institut de Planétologie et d'Astrophysique de Grenoble (IPAG)
Photoionization cross sections of halogen-like Kr and Xe ions have been measured in the photon energy range extending up to 15 eV above the threshold. Two different devices were used, a merged-beam set-up and an ion trap. Combination of the two techniques allows for the extraction of the pure ground state ionization cross section on an absolute scale. Multiconfiguration Dirac-Fock calculations reproduce the magnitude of the direct photoionization cross sections well.
OriginalsprogEngelsk
TidsskriftJournal of Physics B: Atomic, Molecular and Optical Physics
Vol/bind44
Nummer5
ISSN0953-4075
DOI
StatusUdgivet - 14 mar. 2011

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