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Photoionization study of Kr and Xe ions with the combined use of a merged-beam set-up and an ion trap

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  • J.M. Bizau, Universite Paris-Sud
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  • D. Cubaynes, Universite Paris-Sud
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  • N. El Hassan, Universite Paris-Sud
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  • C. Blancard, Bruyères-le-Châtel
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  • M. Coreno, Rome branch and Gas Phase Beamline/Elettra
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  • C. Dehon, Universite Paris-Sud
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  • J. Lemaire, Universite Paris-Sud
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  • F. Folkmann
  • M.F. Gharaibeh, Jordan University of Sciences and Technology
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  • A. Giuliani, Institut national de la recherche agronomique (INRA)
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  • A.R. Milosavljević, L'Orme des Merisiers, Saint Aubin
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  • C. Nicolas, L'Orme des Merisiers, Saint Aubin
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  • R. Thissen, Institut de Planétologie et d'Astrophysique de Grenoble (IPAG)
Photoionization cross sections of halogen-like Kr and Xe ions have been measured in the photon energy range extending up to 15 eV above the threshold. Two different devices were used, a merged-beam set-up and an ion trap. Combination of the two techniques allows for the extraction of the pure ground state ionization cross section on an absolute scale. Multiconfiguration Dirac-Fock calculations reproduce the magnitude of the direct photoionization cross sections well.
TidsskriftJournal of Physics B: Atomic, Molecular and Optical Physics
StatusUdgivet - 14 mar. 2011

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