Photoionization study of Kr and Xe ions with the combined use of a merged-beam set-up and an ion trap

J.M. Bizau, D. Cubaynes, N. El Hassan, C. Blancard, M. Coreno, C. Dehon, J. Lemaire, F. Folkmann, M.F. Gharaibeh, A. Giuliani, A.R. Milosavljević, C. Nicolas, R. Thissen

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Abstract

Photoionization cross sections of halogen-like Kr and Xe ions have been measured in the photon energy range extending up to 15 eV above the threshold. Two different devices were used, a merged-beam set-up and an ion trap. Combination of the two techniques allows for the extraction of the pure ground state ionization cross section on an absolute scale. Multiconfiguration Dirac-Fock calculations reproduce the magnitude of the direct photoionization cross sections well.
OriginalsprogEngelsk
TidsskriftJournal of Physics B: Atomic, Molecular and Optical Physics
Vol/bind44
Nummer5
ISSN0953-4075
DOI
StatusUdgivet - 14 mar. 2011

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