Peak Force Infrared - Kelvin Probe Force Microscopy

Publikation: Bidrag til tidsskrift/Konferencebidrag i tidsskrift /Bidrag til avisTidsskriftartikelForskningpeer review

DOI

  • Devon S Jakob, Lehigh Univ, Lehigh University
  • ,
  • Haomin Wang, Lehigh Univ, Lehigh University
  • ,
  • Guanghong Zeng, Danmarks Nationale Metrologiinstitut
  • ,
  • Daniel E Otzen
  • Yong Yan, San Diego State Univ, California State University System, San Diego State University, Dept Biol
  • ,
  • Xiaoji Xu, Lehigh Univ, Lehigh University

Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provides insight into structure-functional relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. Here, we seamlessly integrate nanoscale photothermal infrared imaging with Coulomb force detection to form Peak Force Infrared - Kelvin Probe Force Microscopy (PFIR-KPFM), which enables simultaneous nano-mapping of infrared absorption, surface potential, and mechanical properties with ~10 nm spatial resolution in a single-pass scan. MAPbBr 3 perovskite crystals of different degradation pathways are studied in situ . Nanoscale charge accumulations are observed in MAPbBr 3 near the boundary to PbBr 2 . PFIR-KPFM also reveals correlations between residual charges and secondary conformation in amyloid fibrils. PFIR-KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.

OriginalsprogEngelsk
TidsskriftAngewandte Chemie International Edition
Vol/bind59
Nummer37
Sider (fra-til)16083-16090
Antal sider8
ISSN1433-7851
DOI
StatusUdgivet - sep. 2020

Bibliografisk note

© 2020 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Se relationer på Aarhus Universitet Citationsformater

ID: 189140695