Observation and theory of the H2 defect in silicon

Brian Bech Nielsen, Jens Dybkjær Holbech, R. Jones, P. Sitch, S. Öberg

    Publikation: Bidrag til bog/antologi/rapport/proceedingKonferencebidrag i proceedingsForskningpeer review

    OriginalsprogEngelsk
    TitelProceedings of the 17th International Conference on Defects in Semiconductors ICDS-17
    Publikationsdato1993
    StatusUdgivet - 1993
    BegivenhedThe 17th International Conference on Defects in Semiconductors ICDS-17 - Gmunden, Østrig
    Varighed: 17 dec. 2010 → …

    Konference

    KonferenceThe 17th International Conference on Defects in Semiconductors ICDS-17
    Land/OmrådeØstrig
    ByGmunden
    Periode17/12/2010 → …

    Citationsformater