@inproceedings{d20a9af0b76211dbbee902004c4f4f50,
title = "Identification of VH in silicon by EPR",
author = "P. Johannesen and J.R. Byberg and Nielsen, {Brian Bech} and P. Stallinga and Nielsen, {K. Bonde}",
year = "1997",
language = "English",
editor = "G. Davies and M.H. Nazar{\'e}",
booktitle = "Proceedings of the 19th International Conference on Defects in Semiconductors",
note = "The 19th International Conference on Defects in Semiconductors ; Conference date: 21-07-1997 Through 25-07-1997",
}