Identification of VH in silicon by EPR

P. Johannesen, J.R. Byberg, Brian Bech Nielsen, P. Stallinga, K. Bonde Nielsen

    Publikation: Bidrag til bog/antologi/rapport/proceedingKonferencebidrag i proceedingsForskningpeer review

    OriginalsprogEngelsk
    TitelProceedings of the 19th International Conference on Defects in Semiconductors
    RedaktørerG. Davies, M.H. Nazaré
    Publikationsdato1997
    StatusUdgivet - 1997
    BegivenhedThe 19th International Conference on Defects in Semiconductors - Aveiro, Portugal
    Varighed: 21 jul. 199725 jul. 1997

    Konference

    KonferenceThe 19th International Conference on Defects in Semiconductors
    Land/OmrådePortugal
    ByAveiro
    Periode21/07/199725/07/1997

    Citationsformater