H interacting with intrinsic defects in Si

Brian Bech Nielsen, Lone Hoffmann, Michael Budde, R. Jones, J. Goss, S. Öberg

    Publikation: Bidrag til bog/antologi/rapport/proceedingKonferencebidrag i proceedingsForskningpeer review

    77 Citationer (Scopus)
    OriginalsprogEngelsk
    TitelProceedings of the 18th International Conference on Defects in Semiconductors
    RedaktørerM. Suezawa, H. Katayama-Yoshida
    Publikationsdato1995
    StatusUdgivet - 1995
    BegivenhedThe 18th International Conference on Defects in Semiconductors - Sendai, Japan
    Varighed: 25 jul. 199528 jul. 1995

    Konference

    KonferenceThe 18th International Conference on Defects in Semiconductors
    Land/OmrådeJapan
    BySendai
    Periode25/07/199528/07/1995

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