Embedded tin nanocrystals in silicon-an electrical characterization

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal article

DOI

Original languageEnglish
Article number055702
JournalNanotechnology
Volume29
Issue number5
Number of pages7
ISSN0957-4484
DOIs
StatePublished - 2 Feb 2018

    Research areas

  • Sn-nanocrystals, SiSn, quantum dots, DLTS, STEM, SN QUANTUM DOTS, N-TYPE SILICON, IRRADIATED SILICON, ELECTRONIC STATES, EPITAXIAL-GROWTH, BAND-STRUCTURE, POOLE-FRENKEL, GESN ALLOYS, SI, DEFECTS

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ID: 120583175