MEM charge densities based on the commonly used Rietveld refinement programs GSAS, FullProf and Jana2006

Publication: ResearchPoster

Original languageEnglish
Publication year2012
Number of pages1
StatePublished - 2012
Event - Grenoble, France

Conference

Conference13th European Powder Diffraction Conference
LocationMinatec
CountryFrance
CityGrenoble
Period28/10/201231/10/2012

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ID: 53420526