Maximum-entropy-method charge densities based on structure-factor extraction with the commonly used Rietveld refinement programs GSAS, FullProf and Jana2006

Publication: Research - peer-reviewJournal article

Original languageEnglish
JournalActa Crystallographica. Section A: Foundations of Crystallography
Volume68
Issue number6
Pages (from-to)750-762
Number of pages13
ISSN0108-7673
DOIs
StatePublished - 2012

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