In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

Research output: Contribution to journal/Conference contribution in journal/Contribution to newspaperJournal article

DOI

    Puspendu Guha, Sachivalaya Marg, Homi Bhabha National Institute, IndiaRaghavendra Rao Juluri, Sachivalaya Marg, Anjan Bhukta, Sachivalaya Marg, Jawaharlal Nehru Centre for Advanced Scientific Research, IndiaArnab Ghosh, Sachivalaya Marg, Indian Institute of Technology, Kharagpur, Santanu Maiti, University of Tubingen, Saha Institute of Nuclear Physics, Arpan Bhattacharyya, Saha Institute of Nuclear Physics, Homi Bhabha National Institute, Velaga Srihari, Bhabha Atomic Research Centre, IndiaParlapalli V. Satyam, Sachivalaya Marg, Homi Bhabha National Institute
Original languageEnglish
JournalCrystEngComm
Volume19
Issue number45
Pages (from-to)6811-6820
Number of pages10
ISSN1466-8033
DOIs
StatePublished - 7 Dec 2017

    Research areas

  • THERMAL-PROPERTIES, EPITAXIAL-GROWTH, SIZE DEPENDENCE, NANOCRYSTALS, NANOPARTICLES, STABILITY, CHEMISTRY, EXPANSION, DIOXIDE, METALS

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