Synchrotron powder diffraction of silicon: high-quality structure factors and electron density

Publication: Research - peer-reviewJournal article

Original languageEnglish
JournalActa Crystallographica Section A: Foundations and Advances
Volume72
Pages (from-to)28-35
Number of pages8
DOIs
StatePublished - 2016

    Keywords

  • charge density, core polarization, silicon, structure factors, synchrotron powder X-ray diffraction

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ID: 101154175