A novel TFET 8T-SRAM cell with improved noise margin and stability

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DOI

OriginalsprogEngelsk
TitelProceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018
Antal sider6
ForlagIEEE
Udgivelsesår11 jul. 2018
Sider39-44
ISBN (trykt)978-1-5386-5755-3
ISBN (Elektronisk)9781538657546
DOI
StatusUdgivet - 11 jul. 2018
Begivenhed21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 - Budapest, Ungarn
Varighed: 25 apr. 201827 apr. 2018

Konference

Konference21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
LandUngarn
ByBudapest
Periode25/04/201827/04/2018
SponsorFaculty of Information Technology and Bionics of Pazmany Peter Catholic University (PPCU), IEEE Council of Electronic Design Automation, Infobionikai Egyesulet

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